1 article(s) from Vilkko, Matti
Methods for rapid frequency-domain characterization of leakage currents in silicon nanowire-based field-effect transistors
- Tomi Roinila,
- Xiao Yu,
- Jarmo Verho,
- Tie Li,
- Pasi Kallio,
- Matti Vilkko,
- Anran Gao and
- Yuelin Wang
Beilstein J. Nanotechnol. 2014, 5, 964–972, doi:10.3762/bjnano.5.110
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